The scanning electron microscope (SEM) has become one of the most widely utilized instruments for materials characterization. Given the overwhelming importance and widespread use of the scanning electron microscope (SEM), it use universities and colleges with materials-oriented programs to provide instruction in the basic operation.
the image resolution of the scanning electron microscope (SEM) is about an order of magnitude poor and sharp. It is able to image bulk samples up to many centimetres in size and (depending on instrument design and settings) has a great depth of field, and so can produce images that are good representations of the three-dimensional shape
Electron Optical System
Electron gun:Openable forked tungsten cathode
Accelerating voltage: 0～30kV
Lens system: Three electron magnetic lens system
Objective lens aperture:Three apertures selectable
Specimen Chamber inner space is ‘=230mm, H=227mm, equipped with 8 ports for EBSD, WDS, EDS, BSE detectors and other attachment installation.
X - lateral motion 80mm,
Y - lateral motion 60mm,
Z - motion 50mm,
Microsofttm WindowstmXP operation system
Digital image, 1024× 768 frame and display resolution 17＂ (LCD monitor)
Plane,line and spot scan.Dual magnification and screen split
Operate And Control Software
The whole new operate software and manual control box make it very convenient and easy to operate the SEM.Parameters of SEM operation can be stored and easily managed.
Image Processing And Analyzing
Image enhancement, Threshold transformation,Ｐ article statistic analysis, Morphology transformation, Gray lelvel histogram display and pseudo－colour transform for gray scale image.
Image Output And Record
Versatile image document formats,support digital monochrome printer and versatile print－out equipment with standard interface
Fully automatic high speed diffusion pump vacuum system (Turbomolecular pump optional)