Home Spectral analytical equipment Optical Thin-Film Measurement System

Optical Thin-Film Measurement System LIMF-10
Thin films are widely used in a variety of applications and the Thin-Film Measurement System can easily determine their properties. Based on interference spectral analysis of multi-reflection beams, this instrument functions non-contact optical measurement of thickness, refractive index, and extinction coefficient of various thin films and coatings.
 
 
 
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