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Portable spectrometer EDX660 XRF

Spectrometer EDX660 XRF

Instrument introduction

EDX660 incorporates SkyrayТs years of experience in precious metals testing with unique product configurations and fully functional software. Its ergonomically design and friendly software interfaces grant the users a simple measurement job.

Performance characteristics

Specialized precious metals and plating thickness testing

Intelligent Precious Metals Analysis Software matches perfectly with the hardware
Arbitrary optional analysis and identification models
Multi-variable non-linear regression procedure

Technical specifications

Analysis range: 30%---99.99%
Measurement time: 60-300 S
Measurement accuracy: 0.1%---99.99%
Measurable range: Au,Ag,Cu,Zn,Ni,Pd,Rh,Cd,Ru,Pt
Weight: 30KG
Size: 350*500*400mm
X-ray source: X-ray tube
Detector: Proportional counter

Standard configurations

Single sample chamber
Proportional counter
Amplified circuit
High and low voltage power
X-ray tube

Application fields

Content determination of precious metals Au, Pt, Ag, etc and jewelries
Precious metals and jewelries processing industries