Diffractometer AdvanXRD Pro

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Diffractometer AdvanXRD Pro defractometer is a general purpose X-ray diffraction system. The instrument features easy reconfiguration of the X-ray optics for a variety of experimental configurations. The Diffractometer AdvanXRD Pro is equipped with two detectors, a standard scintillation detector, and a Speed detector. The instrument is capable of very rapid scans for identification of powders that are simple in composition and abundant on the mount. Much slower scans are usually required for the analysis of complex mixed phases, high resolution work, cell refinement, or identification of trace impurities. Two scan modes are possible, a continuous scan mode which integrates counts over a small angular range (for rapid scans), and a step-scan mode that is used for slower scans and any precision work.

$Diffractometer AdvanXRD Pro$

Specification

Long life and high stability X-ray generator.

Maximum output power: 3 KW
Maximum output voltage: 20-60 KV
Maximum output current: 6 -50 mA
Stability (for within 10 power source variation): < 0.03%
Tube voltage and current manual set-up or program control
High cable: 100 KV, 2 m length
Protective circuits and alarm indicator:

KV high and KV low protective circuits and power monitor: 0.35; 0.7; 1.0; 1.5; 2.0; 2.7KW
Power overload protective circuits, 6 grade.
Line overload protective circuits: 20A
Cooling water alarms: flow (pressure difference) and temperature alarm.
Radiation shield with fail-safe mechanism. Radiation outside shield is lower than 0.2μSv/hr.

Long life x-ray tube.

Anode material: Cu
Maximum power : 2.0 kW
Long fine focus dimensions: 1mm×10mm

Goniometer

Type: Vertical(q/q or q/2q)
Goniometer radius: 180mm
Measurement range: -30°～160°(2q)
Scan speed range: 1/8°～8°/min
Minimum step size: 0.01°
Setting reproducibility: 0.0006°
Accuracy: 0.008°
Slit:

Divergence slit: 1/6°, 1/2°, 1°,2°
Receiving slit:0.1, 0.15, 0.3, 0.45, 0.6, 1.0, 2.0mm
Scattering slit: 1/2°, 1°,2°
Goto zero slit: 0.02mm
Soller slit:two sets

Filter: Ni, Fe

Detector

Type: Scintillation counter
Crystal: NaI.
Maximum Linear Count rate: 500,000 cps
Maximum background noise: <1 cps.

PHA system

Liner amplifier

Maximum gain: 100, for adjust by binary grades.
Stability of gain: ≤0.3%.
Non-liner distortion fidelity coefficient: 0.1～10V for output.
Integral non-liner: ≤±0.3%
Noise being converted into input(standard deviation): ≤15μV

Pulse height analyzer

Level: 0.1～10V.
Tunnel read: 50mV～5V.
Stability: drift < 15mV for level and < 15mV for tunnel road within 8 hours.
Distinguish time: 1 ms.

Data system

Model: Intel Pentium
Clock frequency: 2.4 GHz. (or higher)
Memory: 256MB
Hard disk: 80 GB
floppy disk drivers: 3.5"
CD-ROM drive unit: 40×
Display: 0.28 17" SVGA color
Keyboard and mouse.
Output: HP LaserJet printer

Software

MSAL XD Operating System.

Diffraction line measurement.
Count in fixed time.
Time in fixed count.
Goniometer slew.
Goniometer step forward or backward.
Goniometer alignment.
2θverification.

Processing of Diffraction Pattern.

Editing, displaying and plotting of diffraction pattern.
Peak searching.
Peak area measurement and single peak analysis.
Background elimination.
Smoothing.
Compression of patterns.

Inquiry about Data.

Basic physical and chemical constant.
Periodic table of elements.
Basic physical properties and crystal structures of elements.
Mass absorption coefficient of elements.
Calculation 2θ from d; calculation d from 2θ.
Reference intensity rate K.
Parameters of K characteristic spectra of element.

Analysis software（OPTION）

Qualitative analysis (search /match)
Quantitative analysis.
7.4.3 Diffraction line index.
7.4.4 Lattice constant refinement.
7.4.5 Multiple peak separation.
7.4.6 Elimination of Kα2.

Closed circuit cooling unit （OPTION）

Maximum water pressure: 6kg/cm2.
Automatic temperature control.
Maximum output power: 3Kw

Diffracted-beam Monochorometor with Curved Graphite Crystal.（OPTION）

Radius of cured graphite: 224mm
Reflective efficiency: >28.5%